Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Santa Cruz, Calif. — Pity the IC failure analysis expert. While scan test data provides a starting point for diagnosis, isolating fault locations and identifying defect types is tough. Mentor Graphics ...

Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...

Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...

Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis ...

Test compression offers the benefits of higher quality and lower test cost, but how do you choose the best methodology and tools for your current and future designs? Test compression evaluations ...