Gene expression experiments measure changes in RNA transcript levels to compare how genes are up- or down-regulated across ...

Abstract: High-speed wafer testing is a difficult problem in the automated mass production testing of integrated circuits. A vertical probe card for high-speed wafer test is designed in this paper.

The COVID-19 pandemic forced a number of changes, many of which will remain in place long after it subsides. One important but under-recognized shift could be in the field of clinical diagnostics.

1 Jiangxi Provincial Key Laboratory for Animal Health, College of Animal Science and Technology, Jiangxi Agricultural University, Nanchang, Jiangxi, China 2 Institute of Animal Husbandry and ...