The Atomic Force Microscope System - Bruker Dimension Icon with ScanAsyst® for scanning probe microscopy is capable of nanoscale surface topography and morphology measurements of a range of different ...
KONTICH, Belgium--(BUSINESS WIRE)--Bruker Corporation (Nasdaq: BRKR) today announces the launch of the new X4 POSEIDON™, a high-performance 3D X-ray microscope (XRM) using micro-Computed Tomography ...
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